Scanning Probe Microscopy
The SPM technique allows investigating surfaces with atomic resolution. Beside topography, specific operating modes and probes can be used to characterize lateral variations of frictional, elastic, thermal, and electrical material properties. As a result maps of the lateral variation of these properties are obtained by scanning force microscopy (SFM). Furthermore the probe tip can be used to move and manipulate objects in a defined way. Our main research focus is the investigation of molecular phenomena on surfaces and polymer surface properties under controlled environments.